We eliminate field failures in electronic systems
All chips age.
All chips fail.
Field failures are costly.
Our modern society is reliant on semiconductors. What many people don’t know is that semiconductor wear-out and aging failures are becoming a greater problem at advanced silicon processes. This is leading to increased costs and potentially catastrophic events when electronic systems fail in the field.
From AI-based cloud computing to advanced electronics for mobility, reliable operation over time is required. Advanced semiconductor technologies such as FinFET and Gate All Around (GAA) are increasingly affected by device aging, and unfortunately today’s chip design methods don’t fully account for aging failures.
Tartan’s unique technology mitigates the negative impact of these long-term reliability issues.
Tartan’s patented manufacturing analytics technology improves semiconductor traceability, quality, yield, and reliability.
Nature's Symphony
1. Our patented sensors measure chip manufacturing & reliability parameters
Faces of Humanity
2. We collect data through new product introduction testing
Sands of Time
3. We provide powerful yield & reliability analytics
Beyond Boundaries
4. We enable device traceability from fab to field
