News and Events

Uncovering silent data errors with AI

Uncovering Silent Data Errors with AI

In this EE Times article, Tartan CEO Alan Aronoff describes the problem of Silent Data Errors (SDEs), a growing problem in data centers.


SDEs cause unpredictable behavior within local hardware and potentially spread corrupt data into the larger system.


The article explains why today’s testing and identification solutions are falling short, and outlines how new machine learning (ML) methodologies can offer a way to proactively identify and deal with SDEs.

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SEMICON West 2024

Tartan Presentation:

'The Challenges of Finding Chips

Susceptible to Silent Data Errors'

Thursday, July 11, 2024

11:00a.m.

Access the Slides
Semicon Tartan SIlicon Systems silent data errors

Monitoring Device Aging & Predicting Field Failures

Tartan CEO Alan Aronoff sat down with Dan King, Director of Media at Galaxy Semiconductor, to discuss how Tartan helps customers get high quality, reliable products to market.

Using SLM to Monitor Aging Effects on Automotive Electronics

This joint presentation from Tartan and Siemens was presented at the IEEE International Test Conference, Silicon Lifecycle Management workshop.

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